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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5242 - 5248
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4928 - 4936
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4302 - 4309
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4346 - 4353
IEEE Electron Device Letters > 2017 > 38 > 10 > 1367 - 1370
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3576 - 3581
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2900 - 2905
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2030 - 2037
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1837 - 1845
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1285 - 1293
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1261 - 1268
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 23 - 31
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4823 - 4830
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4160 - 4166
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4226 - 4232
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4423 - 4431
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 4053 - 4059
IEEE Journal of Photovoltaics > 2016 > 6 > 5 > 1298 - 1307
IEEE Transactions on Power Electronics > 2016 > 31 > 8 > 5863 - 5870