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2011 International Reliability Physics Symposium > XT.1.1 - XT.1.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 461 - 463
IEEE Transactions on Electron Devices > 2010 > 57 > 4 > 913 - 918
IEEE Transactions on Electron Devices > 2009 > 56 > 1 > 78 - 84
IEEE Transactions on Electron Devices > 2008 > 55 > 6 > 1494 - 1501