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2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 107 - 114
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3185 - 3191
IEEE Transactions on Electron Devices > 2007 > 54 > 11 > 3064 - 3070
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2551 - 2555