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IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3642 - 3648
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 471 - 476
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3642 - 3648
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 471 - 476