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IET Micro & Nano Letters > 2017 > 12 > 4 > 205 - 208
2011 International Reliability Physics Symposium > 5D.2.1 - 5D.2.6
IEEE Journal of Selected Topics in Quantum Electronics > 2011 > 17 > 3 > 540 - 545
Journal of Display Technology > 2011 > 7 > 6 > 306 - 310
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1822 - 1829
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Electron Device Letters > 2011 > 32 > 4 > 449 - 451
IEEE Electron Device Letters > 2011 > 32 > 4 > 440 - 442
IEEE Electron Device Letters > 2011 > 32 > 5 > 614 - 616
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 295 - 302
IEEE Electron Device Letters > 2011 > 32 > 5 > 683 - 685
Journal of Microelectromechanical Systems > 2011 > 20 > 2 > 418 - 423
IEEE Transactions on Plasma Science > 2011 > 39 > 1-2 > 587 - 592
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 33 - 38
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 419 - 426