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This paper will focus on the fast assessment methodology of FBGA fatigue life through simulation and physics of failure (PoF) analysis under thermal cycle. The structure of fine pitch ball grid array (FBGA) that has been investigated, and been modeled by ANSYS to compare with experimental data. There are two temperature cycling will be used, one is used to verify FEA model, and the other one is used...
Deformations of metal interconnects, cracks in interlayer dielectrics and passivation layers in combination with plastic-packaging are still a major reliability concern for integrated circuit power semiconductors. In order to describe and understand the failure mechanism and its root cause, already a lot of work has been done in the past. However for the first time the impact of the edge profile of...
In this paper, thick film chip resistors with two different types of solder alloys namely SnPb and SnAgCu have been evaluated for the effects of the solder alloy elemental composition on the solder joint failures under cyclic temperature loading conditions. The creep properties of both solders have been modelled using the Garofalo equation and the creep strain energy density has been extracted and...
The paper presents an approach to modeling of shorted turns in rotor field winding of synchronous generator using finite element method. It enables detailed analysis of magnetic field at several operating conditions under healthy and faulty states which are difficult or even impossible to carry out by available measurement methods in industrial environment. Modeling of field winding faults are performed...
Wafer level Chip Scale Package (WLCSP) fulfills the demand for small, light, and portable handheld electronic devices, and it is one of the most advanced packaging concepts. When the WLCSP was assembled on board level, the connection, i.e. solder joints are generally the critical and challenging issue for the whole device's reliability. In addition to the shape and material of solder joints, the material...
A novel reliability qualification methodology to evaluate chip-package interaction (CPI) is presented. Experimental and finite element analysis results are combined in a new protocol that provides solutions to address the need of CPI test vehicles for pre-qualification purposes, more accurate CPI risk projection, and more flexibility for productization.
Electrical Wafer Sort is known to induce stress in the pad structure and can lead to mechanical failures. In the present work, both EWS process (over drive and number of passes) and die pad design (thicknesses and interconnect layer architectures) parameters are evaluated through actual tests and Finite Element Modelling. Thus, for the experimental tests, a dedicated design of experiment is set up...
The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature...
Cracking of the silicon chip of a wafer level chip scale package (WLCSP) is encountered during a thermal cycle test (TCT). This paper attempts to examine the failure mechanism. Both numerical and experimental efforts were devoted to investigate the problem. A series of finite element models with different combinations of material properties and geometric configurations were developed. The results...
The separation of golden ball and die pad due to the poor bonding strength of 1st ball solder joint is the main failure mode in thermo-sonic ball wire bonding. In this paper, nonlinear elastic and elasto-plastic quasi-static analysis of FAB (free air ball) in ultrasonic vibration process is carried out by finite element method with ANSYS. We study the evolution way of compressive stress distributions...
Electronic package devices often endure a substantial number of thermal loading during working. Due to the mismatch of the materials' CTE, the thermal stress can accumulate in the device's interior, which would cause device failure such as die crack, warpage and so on. Especially for the popular multi-chip stacked package, single-chip requires thinner, the tensile strength of chip becomes very small...
Semiconductors are solids whose electrical conductivity is intermediate between that of a conductor and an insulator. Semiconductor devices are active devices that consume, accumulate, and discharge the supplied electric power. They are used as electronic or power devices. The former are employed in the control systems of electrical products such as mobile phones and computers, which are controlled...
This paper presents an investigation on field returned open and short failures related to printed circuit board (PCB), including via hole crack, prepreg crack and insufficient circuit etching. After an experimental study with cross section, time domain reflectometry (TDR), and finite element (FE) modelling, it was found that weak plating and corrosion induced via hole crack was a major root cause...
Solder joint crack is a common failure mode of printed circuit board assembly (PCBA) for electronic products. In order to investigate the crack behavior of fine-pitch SMT solder joints, accelerated thermal cycling (ATC) up to 1500 cycles was performed on advanced PCBAs with low-profile thin small outline package (TSOP). The functional examination result shows that the failure rate of TSOP solder joint...
In this study, three examples of failure analyses of electronic packaging by using the finite element method are presented. These are: (1) the failures (delaminations) near the interface between the filled copper and the silicon and between the copper and the silicon dioxide dielectric of the TSV of a 3D system-in-package (SiP) due to the local thermal expansion mismatch between the silicon and the...
The service of gate crane is the age limit, and there are many problems, such as the fallen rivets and the thinner steel plates due to corrosion. The author makes three dimensional modeling and performs the finite element computation of jib system with the I-DEAS software in this paper, and then carries out failure and effects analyses and fault tree analyses based on the computations. Simulation...
The pusherchain transmission is the core of shearing device, which occurred to the failure of getting stuck resulted in the chain-axis deformation. First, the paper presents the analysis of FMEA, FTA for deformation failure, and carries out the simulation research for failure analysis on wear-failure for chain plate. Then, based on the random effects of significant geometry, material properties, transmission...
The effects of dielectric slots on Cu/Low-k interconnects reliability were studied. Dielectric slots were proven to be effective in suppressing stress-induced void failure but their impact on EM reliability was found to be minimal. Physical failure analysis and finite element simulations were used to explain the possible mechanisms associated to the different effects of dielectric slots on Cu/low-k...
The stress of Cu interconnects embedded in advanced ultra-low-k (ULK) dielectrics was studied for different porosities. Interconnects formed a high porosity material result in a lower stress due to relaxation in the plane. This effect is less significant for narrow lines, where in-plane relaxation is reduced by the dense narrow spacing. The stress in isolated lines was found to be independent of dielectric...
The demand for wafer level packages (WLP) has increased significantly due to its smaller package size and lower cost. However, board level reliability of WLP is still a major concern. This study investigates the board level temperature cycle reliability of three very different wafer level package configurations. Comprehensive studies are carried out through temperature cycle test, failure analysis,...
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