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This paper presents a relaxation oscillator that utilizes a supply-stabilized pico-powered voltage and current reference (VCRG) to charge and reset a chopped pair of MIM capacitors at sub-nW power levels. Specifically, a temperature- and line-stabilized reference voltage is generated via a 4-transistor (4T) self-regulated structure, the output of which is used to bias a temperature-compensated gate-leakage...
Accurate estimation of leakage power at runtime requires post-silicon power measurements across a wide range of temperature and voltage conditions. Testing individual chips, especially at high-temperature corner conditions, is expensive in cost and time. We examine this problem in an industrial context and introduce FreqLeak, a frequency step based method for inexpensive and efficient leakage power...
This letter presents a temperature compensated oscillator for clock generation across a wide temperature range. The proposed technique deploys the characteristics of the constant-biased varactors to nullify the overall oscillator's temperature coefficient (TC), thereby reducing the temperature drift effect on the oscillator frequency output. Fabricated on a CMOS technology,...
Timing-error detection and recovery circuits are implemented in a 65 nm resilient circuit test-chip to eliminate the clock frequency guardband from dynamic supply voltage (VCC) and temperature variations as well as to exploit path-activation probabilities for maximizing throughput. Two error-detection sequential (EDS) circuits are introduced to preserve the timing-error detection capability of previous...
Flashover strength has been measured for a group of solid insulating materials at several frequencies in the range from 60 cycles per second (cps) to 100 megacycles per second. The effects of exposure at nine conditions of temperature and relative humidity have been studied over the temperature range from −55C to 125C. The flashover voltage was measured across a 3/8 inch gap between 3/4 inch diameter...
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