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IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 685 - 693
2011 International Reliability Physics Symposium > CD.2.1 - CD.2.5
IEEE Electron Device Letters > 2011 > 32 > 3 > 318 - 320
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1091 - 1095
IEEE Electron Device Letters > 2011 > 32 > 4 > 482 - 484
IEEE Electron Device Letters > 2011 > 32 > 5 > 626 - 628
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 187 - 193
IEEE Electron Device Letters > 2011 > 32 > 3 > 297 - 299
IEEE Electron Device Letters > 2011 > 32 > 2 > 134 - 136
IEEE Electron Device Letters > 2011 > 32 > 3 > 303 - 305
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 460 - 465
IEEE Electron Device Letters > 2011 > 32 > 2 > 137 - 139
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 473 - 479