Search results
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 362 - 369
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2045 - 2051
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2361 - 2369