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IEEE Electron Device Letters > 2011 > 32 > 4 > 446 - 448
IEEE Electron Device Letters > 2008 > 29 > 7 > 674 - 676
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 181 - 187
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2503 - 2511