Search results
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1889 - 1894
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1889 - 1894