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2010 15th IEEE European Test Symposium > 158 - 163
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 9 > 3140 - 3148
2008 Congress on Image and Signal Processing > 1 > 184 - 187
2008 Congress on Image and Signal Processing > 1 > 174 - 183
2008 Congress on Image and Signal Processing > 1 > 324 - 328
2008 Congress on Image and Signal Processing > 5 > 399 - 402
2008 Congress on Image and Signal Processing > 1 > 375 - 379
2008 Congress on Image and Signal Processing > 3 > 220 - 225