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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5230 - 5235
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3836 - 3840
IEEE Electron Device Letters > 2017 > 38 > 2 > 191 - 194
IEEE Transactions on Nuclear Science > 2017 > 64 > 6-2 > 1549 - 1553
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 227 - 235
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3365 - 3372
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2769 - 2773
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 458 - 460
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 329 - 336
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 191 - 197
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 5 > 1138 - 1149
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3731 - 3736
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4137 - 4144
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 884 - 889
IEEE Microwave and Wireless Components Letters > 2013 > 23 > 8 > 439 - 441
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3112 - 3118
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 2 > 250 - 258
IEEE Transactions on Circuits and Systems I: Regular Papers > 2013 > 60 > 3 > 548 - 556
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 3 > 303 - 309
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 2 > 130 - 135