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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 360 - 369
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2243 - 2249
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Electron Device Letters > 2010 > 31 > 10 > 1149 - 1151