Wyniki wyszukiwania
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3489 - 3493
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2736 - 2743
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 23 - 31
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2163 - 2168
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 9 - 19
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 3 > 447 - 454
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 384 - 393
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1528 - 1539
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2014 > 33 > 9 > 1384 - 1395
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1263 - 1271
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3306 - 3312
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 3 > 168 - 172
IEEE Electron Device Letters > 2011 > 32 > 11 > 1507 - 1509
IEEE Transactions on Industry Applications > 2010 > 46 > 6 > 2556 - 2567
IEEE Transactions on Power Electronics > 2009 > 24 > 1 > 278 - 287
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1478 - 1485