The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We report here the development of a unique and comprehensive computer program (SEMM) to calculate the probability of soft fails in integrated circuits due to alpha particles emanating from the chip materials and due to terrestrial cosmic rays. This model treats all failure modes on an event by event basis allowing for all nuclear reactions and pulse shape effects. It is a three-dimensional design...
This paper describes the effects of water-related species contained in intermetal dielectric layers on the reliability of nonvolatile memory devices. Charge loss of the cells and hot-carrier (HC) lifetime degradation of peripheral N-channel MOSFETs due to the high temperature bake test are accelerated by the water-related species in the intermetal dielectric layer. The relation between the charge...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.