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IEEE Journal of Solid-State Circuits > 2010 > 45 > 7 > 1399 - 1409
2008 3rd International Design and Test Workshop > 199 - 204
2008 International SoC Design Conference > 1 > I-260 - I-264
2008 International SoC Design Conference > 2 > II-162 - II-165
2008 International SoC Design Conference > 1 > I-296 - I-299