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IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1900 - 1906
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 599 - 606
IEEE Journal of Solid-State Circuits > 2008 > 43 > 11 > 2533 - 2545
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1900 - 1906
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 599 - 606
IEEE Journal of Solid-State Circuits > 2008 > 43 > 11 > 2533 - 2545