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In sub-micron technology, a small inaccuracy in computing the probability of occurrence of a soft error results into an unacceptable chip failure rate. A method to estimate the probability of SET propagation to the output gate at any time instant within the latching window is proposed. Its accuracy is evaluated using Monte Carlo simulations.
In this paper we study statistics of statistics. Statistical modeling and analysis have become the mainstay of modern design-manufacturing flows. Most analysis techniques assume that the statistical variation models are reliable. However, due to limited number of samples (especially in the case of lot-to-lot variation), calibrated models have low degree of confidence. The problem is further exacerbated...
Modeling spatial variation is important for statistical analysis. Most existing works model spatial variation as spatially correlated random variables. We discuss process origins of spatial variability, all of which indicate that spatial variation comes from deterministic across-wafer variation, and purely random spatial variation is not significant. We analytically study the impact of across-wafer...
This paper proposes a new approach to analyze crosstalk of coupled interconnects in the presence of process variations. The suggested method translates correlated process variations into orthogonal random variables by principle component analysis (PCA). combined with polynomial chaos expression (PCE), the technique utilizes Stochastic Collocation Method (SCM) to analyze the system response of coupled...
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
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