Search results
2009 IEEE AUTOTESTCON > 184 - 189
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 3 > 330 - 341
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 10 > 1346 - 1357
2009 IEEE AUTOTESTCON > 184 - 189
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 3 > 330 - 341
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 10 > 1346 - 1357