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Robustness and yield enhancement techniques for RF circuits and systems are gaining accelerating traction due to increased PVT variability in nanometer CMOS. One of the more viable approaches that make use of the increasingly heterogeneous systems is digitally-assisted RF, enabling circuit programmability and flexibility. With the inclusion of the more robust digital, RF circuits' impairments may...
This paper presents a 2.4GHz, reconfigurable RF LNA using on-chip peak detection and calibration to measure and optimize its input impedance (S11) and gain (S21) in-situ, compensating for the unpredictable effects of process, voltage and temperature (PVT) variations. Measurement results show that the calibration of the LNA across PVT corners improves the S11 by 5.1dB, S21 by 3dB, while not significantly...
An efficient, accurate and inexpensive RF power meter for cellular phone testing has been developed. The power meter is intended to be used in production and in assembly phase testing of GSM phones. The developed RF power meter is able to use either a logarithmic amplifier type RF detector onboard or an external Schottky-diode type detector located on separate printed wired board. The device is compliant...
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