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In this paper a technique suitable for on-chip IP3/IP2 RF test by embedded RF detectors is presented. A lack of spectral selectivity of the detectors and diverse nonlinearity of the circuit under test (CUT) impose stiff constraints on the respective test measurements for which focused calibration approach and a support by customized models of CUT is necessary. Also cancellation of second-order intermodulation...
This paper presents Automatic Amplitude Level Regulators (AALR) as a practical Built-In-Test (BIST) and demonstrates its application for on-chip testing and local Calibration of integrated RF blocks. The proposed circuit performs full-wave rectification and generates a dc voltage proportional to the amplitude of an RF signal over a wide frequency range. Both CML and MOS RF AALR are designed and fabricated...
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