Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3227 - 3236
IEEE Design & Test > 2017 > 34 > 5 > 72 - 79
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 5 > 1002 - 1012
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3227 - 3236
IEEE Design & Test > 2017 > 34 > 5 > 72 - 79
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 5 > 1002 - 1012