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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1179 - 1183
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 4 > 249 - 253
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 9 > 1645 - 1655
IEEE Transactions on Circuits and Systems I: Regular Papers > 2011 > 58 > 6 > 1239 - 1251
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Circuits and Systems I: Regular Papers > 2011 > 58 > 9 > 2026 - 2037
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 7 > 1192 - 1204
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 10 > 798 - 802
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 238 - 243
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1063 - 1069
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 6 - 13
IEEE Electron Device Letters > 2008 > 29 > 3 > 242 - 245
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 62 - 71
IEEE Electron Device Letters > 2008 > 29 > 7 > 788 - 790