Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 480 - 485
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 69 - 74
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 437 - 444
IEEE Electron Device Letters > 2014 > 35 > 10 > 1001 - 1003
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4125 - 4132
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3132 - 3141
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3119 - 3131
IEEE Electron Device Letters > 2012 > 33 > 8 > 1126 - 1128
IEEE Electron Device Letters > 2010 > 31 > 7 > 662 - 664
Proceedings of the IEEE > 2010 > 98 > 7 > 1127 - 1139
IEEE Electron Device Letters > 2009 > 30 > 10 > 1021 - 1023
IEEE Electron Device Letters > 2008 > 29 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 289 - 296
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 332 - 343
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2554 - 2560