Search results
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 1225 - 1236
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 50 - 62
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 199 - 206
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 12 > 1969 - 1980
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1293 - 1308
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1345 - 1360
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 480 - 485
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3237 - 3250
IEEE Journal of Photovoltaics > 2017 > 7 > 6 > 1511 - 1518
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Power Electronics > 2017 > 32 > 11 > 8718 - 8727
IEEE Transactions on Power Delivery > 2017 > 32 > 5 > 2272 - 2280
IEEE Transactions on Neural Networks and Learning Systems > 2017 > 28 > 10 > 2306 - 2318