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Functional errors and bugs inadvertently introduced at the RTL stage of the design process are responsible for the largest fraction of silicon IC re-spins. Thus, comprehensive functional verification is the key to reduce development costs and to deliver a product in time. The increasing demands for verification led to an increase in FPGA-based tools that perform emulation. These tools can run at much...
The most important step in the final testing of fabricated ASICs or the functional testing of ASIC and FPGA designs is the generation of a complete test set that is able to find the possible errors in the design. Automatic Test Pattern Generation (ATPG) is often done by fault simulation which is very time-consuming. Speed-ups in this process can be achieved by emulating the design on an FPGA and using...
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