Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1851 - 1856
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 58 - 65
IEEE Access > 2017 > 5 > 18918 - 18926
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2757 - 2763
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2930 - 2935
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1658 - 1665
IEEE Journal of the Electron Devices Society > 2016 > 4 > 2 > 66 - 71
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 773 - 780
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 377 - 383
IEEE Electron Device Letters > 2016 > 37 > 6 > 701 - 704
IEEE Journal of the Electron Devices Society > 2015 > 3 > 3 > 88 - 95
IEEE Electron Device Letters > 2015 > 36 > 5 > 427 - 429
IEEE Transactions on Nanotechnology > 2015 > 14 > 2 > 210 - 213
IEEE Transactions on Nuclear Science > 2015 > 62 > 1-2 > 314 - 322
IEEE Journal of the Electron Devices Society > 2015 > 3 > 1 > 37 - 43
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 16 - 22
IEEE Electron Device Letters > 2014 > 35 > 7 > 792 - 794
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3054 - 3059
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1284 - 1291
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 444 - 455