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IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3316 - 3323
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3084 - 3087
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 953 - 956
IEEE Electron Device Letters > 2013 > 34 > 9 > 1103 - 1105
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3663 - 3668
IEEE Electron Device Letters > 2013 > 34 > 11 > 1358 - 1360
IEEE Transactions on Nanotechnology > 2013 > 12 > 6 > 978 - 984
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1517 - 1522
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 985 - 995
IEEE Electron Device Letters > 2011 > 32 > 3 > 255 - 257
IEEE Electron Device Letters > 2010 > 31 > 11 > 1211 - 1213
IEEE Electron Device Letters > 2010 > 31 > 11 > 1175 - 1177
IEEE Electron Device Letters > 2010 > 31 > 10 > 1083 - 1085
IEEE Electron Device Letters > 2010 > 31 > 10 > 1074 - 1076
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106
IEEE Electron Device Letters > 2010 > 31 > 12 > 1368 - 1370
IEEE Electron Device Letters > 2010 > 31 > 4 > 278 - 280
IEEE Transactions on Electron Devices > 2010 > 57 > 6 > 1343 - 1354