The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A faulty interposer in a 2.5-D integrated circuit often results in a hefty loss as the potentially expensive known-good-dies bonded on the interposer will have to be discarded as well. To avoid such a last-minute loss during a multichip integration process, built-in self-repair (BISR) is highly valuable. Even though there have been many BISR schemes in the literature, the proposed method offers a...
FPGA is widely used in military and aerospace applications and FPGA testing is the most effective means to ensure the reliability of them. Interconnect Resources testing is one of the most important parts of FPGA testing since that most of the faults occur on Interconnect Resources. FPGA needs to be configured as specified circuits before being tested and conventional HDL-based configuration can not...
This paper presents a novel build-in-self-test (BIST) manufacture-oriented interconnect test strategy of SRAM-based field programmable gate arrays (FPGA). Programmable switches (PSs) and line segments are tested separately, which is different from previous methods. An improved depth-first-search (DFS) algorithm is developed for automatically deriving minimal or near minimal test configuration patterns...
Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized...
In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.