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IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1499 - 1507
IEEE Electron Device Letters > 2008 > 29 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 289 - 296
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 332 - 343