Search results
IEEE Transactions on Electromagnetic Compatibility > 2018 > 60 > 1 > 243 - 251
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 1 - 10
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 73 - 81
IEEE Design & Test > 2017 > 34 > 6 > 54 - 62
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5284 - 5287
IEEE Transactions on Mobile Computing > 2017 > 16 > 12 > 3445 - 3458
IEEE Microwave and Wireless Components Letters > 2017 > 27 > 11 > 1007 - 1009
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3033 - 3044
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 11 > 2821 - 2834
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 11 > 1897 - 1910
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4002 - 4010
IEEE Internet of Things Journal > 2017 > 4 > 5 > 1399 - 1407
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2893 - 2906
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2971 - 2975
IEEE Transactions on Industrial Electronics > 2017 > 64 > 10 > 8364 - 8372
IEEE Transactions on Computers > 2017 > 66 > 10 > 1831 - 1836
IEEE Transactions on Computers > 2017 > 66 > 10 > 1734 - 1746
IEEE Transactions on Computers > 2017 > 66 > 10 > 1824 - 1830
IEEE Electron Device Letters > 2017 > 38 > 9 > 1328 - 1330
IEEE Transactions on Computers > 2017 > 66 > 9 > 1573 - 1584