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IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 855 - 861
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 870 - 876
2010 International Electron Devices Meeting > 35.3.1 - 35.3.4
2010 15th IEEE European Test Symposium > 132 - 137
2009 IEEE Custom Integrated Circuits Conference > 531 - 534