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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 685 - 687
IEEE Transactions on Magnetics > 2015 > 51 > 12 > 1 - 4
IEEE Transactions on Nuclear Science > 2015 > 62 > 5-2 > 2294 - 2301
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 2020 - 2030
IEEE Transactions on Magnetics > 2012 > 48 > 3 > 1134 - 1138
IEEE Electron Device Letters > 2012 > 33 > 6 > 797 - 799
IEEE Electron Device Letters > 2012 > 33 > 3 > 417 - 419
IEEE Electron Device Letters > 2011 > 32 > 2 > 188 - 190
IEEE Electron Device Letters > 2011 > 32 > 3 > 267 - 269
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3925 - 3932
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 3072 - 3080
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2614 - 2620