The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Readout integrated circuits involving a pixel-level analog-to-digital converter (ADC) are studied for 320 times 240 microbolometer focal plane arrays (FPAs). Each 2times2 pixel shares an readout circuit, including an operational amplifier(op-Amp), an integration capacitor and a single slope ADC. This readout circuit is designed to achieve 35 times 35 mum2 pixel size in 0.35 mum 2-poly 3-metal CMOS...
In this paper, we have proposed a new high precision ramp waveform generator for low cost ADC test. With proposed test method combined with histogram analysis, an ADC can be easily tested on general digital testers. In our approach, we combine a traditional ramp generator with proper gain of operational amplifier (OPA) for ADC test. This new ramp generator structure can reduce the effect of output...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.