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2013 Spanish Conference on Electron Devices > 257 - 260
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 157 - 163
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 219 - 226
IEEE Electron Device Letters > 2010 > 31 > 12 > 1368 - 1370
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1063 - 1069