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Nonlinear voltage sensitive protection elements, e.g. Multi-Layer Varistor (MLV) or Transient Voltage Suppressor (TVS) are useful to protect IC pins from ESD on System Level. Such elements might exhibit a significant voltage overshoot for fast transients. This work describes a combined time and frequency domain characterization method and its application to an MLV. Impedance measurements with VNA...
A comprehensive model of a clock line including large and small signal pin parameters, as well as channel parameters is presented. The small signal model allows analysis of in-band interference which can lead to soft failures, while large signal models allow for the simulation of current sharing between driver/receiver pin pairs.
This paper addresses the generation of behavioral models of digital ICs for signal and power integrity simulations. The proposed models are obtained by external port measurements and by the combined application of specialized state-of-the-art modeling techniques. The proposed approach is demonstrated on the I/O buffers and the core power supply ports of a commercial 90 nm flash memory.
The purpose of this study is to develop a method to measure transmission line parameters for protection relay setting. For relaying schemes such as distance relays, current differential relays and fault locators, it is very useful to ascertain the precise setting values in service, without the need for setting calculations prior to installation, and also for the relays to be able to adaptively change...
The recent advancement on niobium nitride (NbN) superconducting nanowire single photon detectors (SNSPDs) have drawn considerable attentions by many of their particular figures of merit. In this work, we report our experimental efforts resulting from combinations of dc, RF/microwave and optoelectronic characterizations of this device. The dc IV measurement is under-taken in the full voltage bias range...
With the successful completion of its refurbishment the Z machine at Sandia is now routinely operating with currents over 26 MA into various loads. Now that the machine is operating we can measure current and voltage at various locations throughout the machine and compare with circuit code predictions. These measurements have led to improvements in the model that provide a more accurate predictive...
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