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Designing aliasing-free space support hardware for built-in self-testing in very large scale integration circuits and systems is of immense significance, specifically due to the design paradigm shift in recent years from system-on-board to system-on-chip. This paper develops an approach to designing aliasing-free space compaction hardware targeting particularly embedded cores-based system-on-chips...
The following topics are dealt with: VLSI; system-on-chip; integrated circuit design; green computing; logic synthesis; logic testability; design for test; network-on-chip; and DSP.
A logic fault test simulation environment for core-based digital systems is proposed in this paper. The simulation environment emulates a typical built-in self-test (BIST) environment with test pattern generator that sends its outputs to a circuit under test (CUT) and the output streams from the CUT are fed into a response data analyzer. The developed simulator is suitable for testing digital IP cores...
The complexity of modern digital circuits has increased enormously because of paradigm shift from system-on-board to designs embracing embedded cores-based system-on-chips (SOCs). The ensuing intricacy has resulted in a huge challenge in setting up their appropriate fault analysis and testing environment. Though enormous efforts were directed to rapidly test very large-scale integration(VLSI) circuit...
This paper presents an industrial case study on logic diagnosis targeting system-on-chip (SoC). We first show the complexity and the issues related to the diagnosis of SoC. Then we propose a diagnosis approach based on the effect-cause paradigm. This approach consists of two phases: (i) a fault localization phase resorting to the critical path tracing to determine a set of suspects, (ii) a fault model...
Over the past 20 years, EDA has developed a solid digital implementation methodology that combines some restrictions on the design style with a set of comprehensive tools leading to predictable design flows. The recent increased use of analog components in complex SOC designs triggered a set of verification challenges ranging from simple connectivity problems to complex interferences between analog...
IEEE 1500 is a standard under development which intends to improve ease of test reuse and test integration with respect to the core-based SoCs. The subject paper proposes developing test environment and test methodologies for digital embedded cores based system-on-a-chip (SoC). The digital cores used in the study were constructed from ISCAS 85 combinational and ISCAS 89 sequential benchmark circuits...
Summary form only given. As SoCs continue to evolve to have more and more programmable elements and processors on them, the opportunity to tune the processors, interconnect and other blocks to match the intended application and gain advantages of performance and energy consumption is one that many designers are still not aware of. Experience on a wide variety of SoC designs has shown that significant...
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