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IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
2010 International Electron Devices Meeting > 34.2.1 - 34.2.4
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
2010 International Electron Devices Meeting > 34.2.1 - 34.2.4