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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932