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2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-4.1 - 6A-4.7
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 298 - 303
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-2-1 - DI-2-5
IEEE Transactions on Computers > 2017 > 66 > 2 > 361 - 367
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3595 - 3604
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3524 - 3529
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 840 - 846
IEEE Electron Device Letters > 2014 > 35 > 5 > 545 - 547
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.3.1 - XT.3.4
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
IEEE Electron Device Letters > 2012 > 33 > 8 > 1126 - 1128
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 391 - 398