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IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 431 - 439
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
Proceedings of the IEEE > 2008 > 96 > 2 > 287 - 305
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2348 - 2353