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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 101 - 104
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 132 - 139
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 11 > 726 - 730
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 369 - 375
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1385 - 1392
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 6-2 > 1755 - 1763
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2830 - 2837
IEEE Electron Device Letters > 2011 > 32 > 12 > 1668 - 1670
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 4 > 460 - 475
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 458 - 465
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2348 - 2353