Search results
IEEE Access > 2016 > 4 > 6133 - 6150
2010 IEEE International Conference on Image Processing > 2317 - 2320
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2010 > 32 > 1 > 56 - 71
IEEE Access > 2016 > 4 > 6133 - 6150
2010 IEEE International Conference on Image Processing > 2317 - 2320
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2010 > 32 > 1 > 56 - 71