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IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 338 - 346
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 743 - 753
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 338 - 346
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 743 - 753