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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 727 - 737
Microelectronics Reliability > 2016 > 64 > C > 429-433
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 727 - 737
Microelectronics Reliability > 2016 > 64 > C > 429-433