Search results
2009 IEEE International SOC Conference (SOCC) > 199 - 202
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1516 - 1522
Measurement > 1996 > 18 > 4 > 201-205
2009 IEEE International SOC Conference (SOCC) > 199 - 202
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1516 - 1522
Measurement > 1996 > 18 > 4 > 201-205