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2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-1.1 - WB-1.6
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-5.1 - 2D-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-2.1 - 5A-2.6
2017 IEEE International Reliability Physics Symposium (IRPS) > RT-5.1 - RT-5.5
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1489 - 1497
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1683 - 1688
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1642 - 1646
IEEE Electron Device Letters > 2017 > 38 > 4 > 477 - 480
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1412 - 1417
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1511 - 1518
IEEE Electron Device Letters > 2017 > 38 > 4 > 505 - 508
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 848 - 855
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 184 - 190
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2017 > 7 > 1 > 60 - 70