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IEEE Electron Device Letters > 2017 > 38 > 5 > 592 - 595
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2216 - 2220
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-4.1 - WB-4.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-4.1 - 2A-4.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-3.1 - 2D-3.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-4.1 - 6B-4.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-2.1 - 3E-2.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-1.1 - WB-1.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 2F-2.1 - 2F-2.10
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-4.1 - 2D-4.7
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-5.1 - 2D-5.6