Szukanie zaawansowane
Szukanie zaawansowane w ludziach
2013 IEEE International Electron Devices Meeting > 6.2.1 - 6.2.4
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.7.1 - XT.7.5
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.7.1 - GD.7.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.2.1 - 5D.2.5
IEEE Electron Device Letters > 2012 > 33 > 2 > 146 - 148
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 2 > 130 - 135
IEEE Electron Device Letters > 2012 > 33 > 3 > 303 - 305
IEEE Electron Device Letters > 2012 > 33 > 2 > 218 - 220
IEEE Electron Device Letters > 2011 > 32 > 4 > 464 - 466
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 770 - 775
IEEE Electron Device Letters > 2011 > 32 > 6 > 800 - 802
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3342 - 3349
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 39 - 45
IEEE Electron Device Letters > 2011 > 32 > 7 > 835 - 837
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2752 - 2758
2010 International Electron Devices Meeting > 11.6.1 - 11.6.4